Abstract
This chapter discusses potential applications of CODEF for IC manufacturing. Three main areas are investigated in detail: (a) yield estimation, (b) fault modeling, and (c) failure analysis.
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© 1996 Kluwer Academic Publishers
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Khare, J.B., Maly, W. (1996). CODEF - Applications. In: From Contamination to Defects, Faults and Yield Loss. Frontiers in Electronic Testing, vol 5. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-1377-9_5
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DOI: https://doi.org/10.1007/978-1-4613-1377-9_5
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