Abstract
We presented theorems on justification equivalence in Chapters 2 and 3 for circuits assumed to have no physical defects. These circuits are called fault-free circuits. Testing of integrated circuits requires consideration of cases where we assume that the circuit-under-test has defects.
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© 1996 Kluwer Academic Publishers
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Chen, X., Bushnell, M.L. (1996). Fault Effects. In: Efficient Branch and Bound Search with Application to Computer-Aided Design. Frontiers in Electronic Testing, vol 4. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-1329-8_5
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DOI: https://doi.org/10.1007/978-1-4613-1329-8_5
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4612-8571-7
Online ISBN: 978-1-4613-1329-8
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