Abstract
Short range (few nanometers) structural features are often correlated to local stoichiometry inhomogeneities. The suitable tool for studying such phenomena is undoubtly electron microscopy; it can indeed provide simultaneously a diffraction pattern (ED: electron diffraction), an atomic resolution image (HREM: high resolution electron microscopy) and a chemical analysis (EDS: energy dispersive spectrometry) of small or large areas; a statistical view of the sample can be obtained through the observation and the comparison of numerous grains. The will to characterize materials on a so small scale is justified by a fundamental goal: to know, to predict and to understand the materials, structural mechanisms and properties, by analysing some pieces of the puzzle.
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© 1996 Plenum Press, New York
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Hervieu, M. (1996). Nanostructures of Low Dimensional Oxides: Nature and Role of Defects. In: Schlenker, C., Dumas, J., Greenblatt, M., van Smaalen, S. (eds) Physics and Chemistry of Low-Dimensional Inorganic Conductors. NATO ASI Series, vol 354. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-1149-2_3
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DOI: https://doi.org/10.1007/978-1-4613-1149-2_3
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