X-Ray and Neutron Structure Analysis in Materials Science

pp 15-21

Quantitative Reference Intensity Analysis: Methodology and Means for Verification of Results

  • Briant L. DavisAffiliated withInstitute of Atmospheric Sciences, South Dakota School of Mines and Technology

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The success of any quantitative x-ray diffraction (XRD) analytical technique depends upon good control of particle size in the sample, elimination of preferred orientation of particles, and, in the case of the reference intensity method (RIM)1 , 2, the measurement of high-quality reference intensity ratios (ki, or RIR). The method developed in our laboratory eliminates preferred orientation by use of an aerosol suspension technique3 , 4 in which the sample particles are carried vertically into a glass fiber filter5 , 6.