Quantitative Reference Intensity Analysis: Methodology and Means for Verification of Results
The success of any quantitative x-ray diffraction (XRD) analytical technique depends upon good control of particle size in the sample, elimination of preferred orientation of particles, and, in the case of the reference intensity method (RIM)1 , 2, the measurement of high-quality reference intensity ratios (ki, or RIR). The method developed in our laboratory eliminates preferred orientation by use of an aerosol suspension technique3 , 4 in which the sample particles are carried vertically into a glass fiber filter5 , 6.
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- 1.F. H. Chung, A new x-ray diffraction method for quantitative multicomponent analysis, Adv. X-ray Anal. 17: 106 (1974).Google Scholar
- 2.B. L. Davis, “Standardless” x-ray diffraction quantitative analysis, Atm. Environ. 14: 217 (1980).Google Scholar
- 3.B. L. Davis, A tubular aerosol suspension chamber for the preparation of powder samples for x-ray diffraction analysis, Powd. Diff. 1: 240 (1986).Google Scholar
- 4.B. L. Davis and L. R. Johnson, On the use of various filter substrates for quantitative particulate analysis by x-ray diffraction, Atm. Environ. 16: 273 (1982).Google Scholar
- 5.B. L. Davis and L. R. Johnson, Sample preparation and methodology for x-ray quantitative analysis of thin aerosol layers deposited on glass fiber and membrane filters, Adv. X-ray Anal. 25: 295 (1982).Google Scholar
- 7.B. L. Davis and L. R. Johnson, The use of mass absorption in quantitative x-ray diffraction analysis, Adv. X-ray Anal. (in press).Google Scholar
- 8.B. L. Davis and M. J. Walawender, Quantitative mineralogical analysis of granitoid rocks: A comparison of x-ray and optical techniques, Am. Mineral. 67: 1135 (1982).Google Scholar