Atomic Beam Scattering Studies of Ordering at Surfaces
The scope of this workshop is to bring the “growth” people and the “surface science” people closer; to make them interact. This contribution tries to parallalize this scope by discussing experimental aspects of the interaction between the substrate surface and the growing film. The focus is on the structure and dynamics of rare gas films growing on close packed metal substrates as investigated by high-resolution He scattering.
The influence of the substrate on the film growth can be easier understood by realizing the crucial role played by the first adsorbed monolayer. Indeed, on the one hand, the properties and in particular the structure of this first layer are decisively influenced by the substrate. On the other hand, the nature of the film growth depends directly on the structure of this first monolayer; e.g. layer-by-layer growth can hardly take place if the structure and the lattice constant of the first monolayer deviate markedly from the equilibrium structure and lattice constant of the bulk material.
The influence of the substrate on the structure and dynamics of the first adlayer proceeds via the strength and lateral corrugation of the holding potential and — in real life — also via the always present defects. The influence of the lateral corrugation of the holding potential on the structure — in particular on the lattice constant and orientation — of the first adsorbed full monolayer will be emphasized. The controversial issue concerning the height of the lateral corrugation is also discussed.
KeywordsCoincident Site Lattice Monolayer Film Surface Phonon Average Domain Size Strong Substrate
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- 2.J. G. Dash, Physics Today, Dec. 1985, 26.Google Scholar
- 6.T. Engel and K. H. Rieder, Springer Tracts in Modern Physics (Springer, Berlin, 1982), Vol. 91.Google Scholar
- 16.K. Kern and G. Comsa, in Physics and Chemistry of Solid Surfaces VII. R. Vanselow and R. F. Howe, eds. (Springer, Berlin, 1988) p. 64.Google Scholar
- 43.R. J. Murihead, J. G. Dash and J. Krim, Phys. Rev. B29, 6985 (1984).Google Scholar