Quantitative Wavelength-Dispersive X-Ray Microanalysis
Experiment 18.1: Measurement of X-Ray Intensities, (a–e) The tables on the following pages (A18.1–A18.3) summarize the data obtained from the nickel, chromium, and aluminum standards as well as from four or five analyses of the NiCrAl sample at each of three operating voltages of 10, 15, and 30 kV. Counting times of 100 sec per analysis were used. The beam currents used were 20 nA at 10 kV, 11 nA at 15 kV, and 5 nA at 30 kV. The beam currents were selected to obtain no more than 20,000 counts per sec of ALKα from the Al standard. Values of NB, NT, and Np are listed in the tables as well as the calculated values of the relative counting error (RCE). The ROE is well below 1%. Errors in the analysis of >1% relative are due to factors other than the counting uncertainties of each measurement.
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