Convergent Beam Electron Diffraction

  • Charles E. Lyman
  • Joseph I. Goldstein
  • Alton D. RomigJr.
  • Patrick Echlin
  • David C. Joy
  • Dale E. Newbury
  • David B. Williams
  • John T. Armstrong
  • Charles E. Fiori
  • Eric Lifshin
  • Klaus-Ruediger Peters

Abstract

The objective of this laboratory session is to introduce the principal method of obtaining electron diffraction information from regions smaller than the limit of conventional selected area diffraction (SAD), about 0.5 μm in diameter. The technique is termed convergent beam electron diffraction (CBED). We will see that CBED patterns can be used to generate much more information than can be obtained from SAD patterns.

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References

  1. [1]
    M. Raghavan, J. C. Scanlon, and J. Steeds, Metallurgical Transactions 15A (1984) 1299.Google Scholar
  2. [2]
    B. F. Buxton, J. A. Eades, J. Steeds, and G. Rackman, Philosophical Transactions of the Royal Society of London 281 (1976) 181.Google Scholar

Copyright information

© Plenum Press, New York 1990

Authors and Affiliations

  • Charles E. Lyman
    • 1
  • Joseph I. Goldstein
    • 1
  • Alton D. RomigJr.
    • 2
  • Patrick Echlin
    • 3
  • David C. Joy
    • 4
  • Dale E. Newbury
    • 5
  • David B. Williams
    • 1
  • John T. Armstrong
    • 6
  • Charles E. Fiori
    • 5
  • Eric Lifshin
    • 7
  • Klaus-Ruediger Peters
    • 8
  1. 1.Lehigh UniversityBethlehemUSA
  2. 2.Sandia National LaboratoriesAlbuquerqueUSA
  3. 3.University of CambridgeCambridgeEngland
  4. 4.University of TennesseeKnoxvilleUSA
  5. 5.National Institute of Standards and TechnologyGaithersburgUSA
  6. 6.California Institute of TechnologyPasadenaUSA
  7. 7.GE Corporate Research and DevelopmentSchenectadyUSA
  8. 8.The University of Connecticut Health CenterFarmingtonUSA

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