Abstract
As part of the general investigation of rapid reliability assessment the devices being studied experimentally were also simulated using a standard circuit simulation package, PSPICE (Microsim Corporation), which i3 a version written for use on the IBM personal computer. The simulations gave the size and shape of the waveforms occuring in the circuits being studied and the effect of different conditions within the circuit on these waveforms.
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Reference
Syrzycki, M., 1987, Proc. 1987 Int. Test Conf., IEEE, 148–57.
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© 1990 Plenum Press, New York
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Dorey, A.P., Jones, B.K., Richardson, A.M.D., Xu, Y.Z. (1990). The Devices Studied and their Simulation. In: Rapid Reliability Assessment of VLSICs. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0587-3_2
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DOI: https://doi.org/10.1007/978-1-4613-0587-3_2
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4612-7879-5
Online ISBN: 978-1-4613-0587-3
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