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(e,2e) Coincidence Measurements at Low Energy

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Book cover Selected Topics on Electron Physics

Part of the book series: Physics of Atoms and Molecules ((PAMO))

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Abstract

Electron-atom ionisation event processes can be classified in three regions as defined by the excess incident electron energy above the ionisation threshold. The definition and range of these regions is necessarily somewhat arbitrary, however in this paper these regions are considered to be (figure 1):

  • The threshold region, ranging from 0eV to around 4eV above threshold.

  • The intermediate energy region, ranging from around 4eV to 100eV above threshold.

  • The high energy region, where the incident electron energy exceeds 100eV above threshold.

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Author information

Authors and Affiliations

  1. Schuster Laboratory, Manchester University, Manchester, M13 9PL, UK

    A. J. Murray, N. J. Bowring & F. H. Read

Authors
  1. A. J. Murray
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  2. N. J. Bowring
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  3. F. H. Read
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Editor information

Editors and Affiliations

  1. University of Edinburgh, Edinburgh, Scotland

    D. Murray Campbell

  2. University of Stirling, Stirling, Scotland

    Hans Kleinpoppen

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© 1996 Plenum Press

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Murray, A.J., Bowring, N.J., Read, F.H. (1996). (e,2e) Coincidence Measurements at Low Energy. In: Campbell, D.M., Kleinpoppen, H. (eds) Selected Topics on Electron Physics. Physics of Atoms and Molecules. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0421-0_1

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  • DOI: https://doi.org/10.1007/978-1-4613-0421-0_1

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4613-8044-3

  • Online ISBN: 978-1-4613-0421-0

  • eBook Packages: Springer Book Archive

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