Abstract
Although narrow-miniband superlattices have an important transport inhomogeneity manifested in the formation of high-field domains and in periodic structure of the I-V characteristic when the applied voltage increases beyond a threshold,1 the most interesting transport phenomena in wide-miniband systems are those related to Esaki-Tsu negative differential mobility (NDM) at relatively low electric field.2 We report here on a careful examination of the frequency dependence of small-signal ac mobility and the possible fluctuation instability of a planar superlattice subject to negative differential miniband conductance. Our analysis is based on three-dimensional hydrodynamic nonlinear balance equations with accurate microscopic treatment of phonon and impurity scatterings.
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REFERENCES
L. Esaki and L.L. Chang, Phys. Rev. Lett. 33, 495 (1974)
L. Esaki and R. Tsu, IBM J. Res. Dev. 14, 61 (1970)
X.L. Lei and CS. Ting, Phys. Rev. B 30, 4809 (1984); 32, 1112 (1985)
X.L. Lei, N.J.M. Höring and H.L. Cui, Phys. Rev. Lett. 66, 3277, (1991)
X.L. Lei, Phys. Stat. Sol. (b), 170, 519 (1992)
X.L. Lei, J. Cai, and L.M. Xie, Phys. Rev. B 38, 1529 (1988)
A.A. Ignatov and V.L. Shashkin, Sov. Phys. JETP 66, 526 (1987)
M. Biittiker and H. Thomas, Phys. Rev. Lett. 38, 78 (1977)
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© 1996 Plenum Press, New York
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Lei, X.L., Horing, N.J.M., Cui, H.L., Thornber, K.K. (1996). Negative Differential Mobility and Convective Instability of a Semiconductor Superlattice. In: Hess, K., Leburton, JP., Ravaioli, U. (eds) Hot Carriers in Semiconductors. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0401-2_45
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DOI: https://doi.org/10.1007/978-1-4613-0401-2_45
Publisher Name: Springer, Boston, MA
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