Huang Diffuse Scattering from Small Planar Dislocation Loops

  • Zhongfu Zhou
  • Yaru Zhang
  • Adrian P. Sutton
  • Sergei L. Dudarev
  • Michael L. Jenkins
  • Mark A. Kirk
  • George N. Greaves
  • Lixin Xiao
Conference paper
Part of the Lecture Notes in Electrical Engineering book series (LNEE, volume 206)


This paper gives out a theoretical framework of electron/X-ray Huang diffuse scattering intensity at the immediate vicinity of Bragg reflection in reciprocal space. Nodal lines of two types in the simulated patterns of Huang diffuse scattering intensity are discussed in connection with a loop shape factor and the Huang diffuse scattering intensity from infinitesimal loops. It is suggested that the Huang diffuse scattering method is supplementary to the conventional TEM amplitude contrast imaging techniques and it has advantages in characterizing the morphology of very small dislocation loop when other methods fail.


Dislocation loops Diffuse scattering Huang diffuse scattering Kinematical theory 


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Copyright information

© Springer-Verlag London 2013

Authors and Affiliations

  • Zhongfu Zhou
    • 1
    • 2
    • 3
  • Yaru Zhang
    • 4
  • Adrian P. Sutton
    • 5
  • Sergei L. Dudarev
    • 6
  • Michael L. Jenkins
    • 7
  • Mark A. Kirk
    • 8
  • George N. Greaves
    • 9
  • Lixin Xiao
    • 10
  1. 1.Key Laboratory for Material MicrostructuresShanghai UniversityShanghaiChina
  2. 2.Department of MaterialsUniversity of OxfordOxfordUK
  3. 3.Institute of Mathematics and PhysicsAberystwyth UniversityAberystwythUK
  4. 4.Key Laboratory for Material MicrostructuresShanghai UniversityShanghaiChina
  5. 5.Department of PhysicsImperial CollegeLondonUK
  6. 6.Culham Centre for Fusion EnergyOxfordshireUK
  7. 7.Department of MaterialsUniversity of OxfordOxfordUK
  8. 8.Materials Science DivisionArgonne National LaboratoryArgonneUSA
  9. 9.Institute of Mathematics and PhysicsAberystwyth UniversityAberystwythUK
  10. 10.State Key Laboratory for Mesoscopic Physics and Department of PhysicsPekingChina

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