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Transmission Electron Microscopy: A Multifunctional Tool for the Atomic-scale Characterization of Nanoalloys

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Part of the book series: Engineering Materials ((ENG.MAT.))

Abstract

Nanoalloys are attracting increasing attention because of the immense technological potential that arises from combination of size effects with composition effects. However, the design of nanosystems with new and tunable properties requires understanding the complex phenomena that influence the size, shape, composition, and atomic structure of multimetallic alloy cluster. In that regard, Transmission Electron Microscope (TEM) is one of the most complete characterization tools for studying nanoalloys. Here we will detail how TEM gives access to morphological, structural and chemical information on individually analyzed nanoparticles. We will describe the principle, advantages and limits of the different presented techniques. To finish, we will shed light on the outstanding performances of the recently developed aberration corrected microscopes that provide unprecedented opportunities to analyze dynamical processes at high resolution and atomic scale-chemistry in nanoalloys.

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Notes

  1. 1.

    EDX spectrum imaging is similar in principle to EELS spectrum imaging, but instead of acquiring an EELS spectrum at each pixel (Sect. 4.2.2), one acquires an X-ray spectrum. Similarly, post-acquisition processing of the obtained spectrum imaging data cube allows the production of chemical maps.

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  1. Laboratoire Matériaux et Phénomènes Quantiques (UMR CNRS 7162), Bâtiment Condorcet, Case courrier 7021, Université Paris Diderot—Paris 7, 75205, Paris cedex 13, France

    Damien Alloyeau

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  1. Damien Alloyeau
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Correspondence to Damien Alloyeau .

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  1. , Matériaux et Phénomènes Quantiques, Université Paris Diderot, Bâtiment Condorcet, Paris, 75205, France

    Damien Alloyeau

  2. , Campus de Luminy, CINaM-CNRS, Case 913 913, Marseille, 13288, France

    Christine Mottet

  3. , Université Paris Diderot, Université Paris Diderot, Bâtiment Condorcet Case 7021, Paris, 75205, France

    Christian Ricolleau

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© 2012 Springer-Verlag London

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Alloyeau, D. (2012). Transmission Electron Microscopy: A Multifunctional Tool for the Atomic-scale Characterization of Nanoalloys. In: Alloyeau, D., Mottet, C., Ricolleau, C. (eds) Nanoalloys. Engineering Materials. Springer, London. https://doi.org/10.1007/978-1-4471-4014-6_4

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