Abstract
In the previous chapter we gave the theoretical basis of a functional testing method for systems specified as X-machines. The method generates test sets from the specification that ensure that the system is fault-free provided that it is made of fault-free components and meets some “design for testing” requirements.
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© 1998 Springer-Verlag London Limited
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Holcombe, M., Ipate, F. (1998). Refinement Testing. In: Correct Systems. Applied Computing. Springer, London. https://doi.org/10.1007/978-1-4471-3435-0_8
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DOI: https://doi.org/10.1007/978-1-4471-3435-0_8
Publisher Name: Springer, London
Print ISBN: 978-3-540-76246-1
Online ISBN: 978-1-4471-3435-0
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