Abstract
One problem of the input domain-based software reliability models is the large number of test cases required to obtain a high confidence in reliability estimation, because testing has to be restarted from beginning after any fault correction is performed. This paper intends to overcome this problem by considering relations between the programs before and after fault corrections and therefore making use of the testing data collected from the previous testing stages. For this purpose we propose an input domain-based reliability growth model. Both partition and random testing can be used to generate input cases for test runs. It is generally considered in the model that input generation, fault detection and fault correction are all imperfect. It will be shown that some existing reliability models can be viewed as the special cases of our model.
This work was partly sponsored by the fellowship of the European Commission HumanCapital and Mobility Programme, CaberNet, at LAAS-CNRS, Toulouse.
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© 1997 Springer-Verlag London Limited
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Chen, Y., Arlat, J. (1997). Modeling Software Dependability Growth under Input Partition Testing. In: Schoitsch, E. (eds) Safe Comp 96. Springer, London. https://doi.org/10.1007/978-1-4471-0937-2_12
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DOI: https://doi.org/10.1007/978-1-4471-0937-2_12
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