Skip to main content

Control-relevant Identification and Robust Motion Control of a Wafer Stage

  • Chapter
Iterative Identification and Control

Abstract

This chapter illustrates the identification of control-relevant models and the subsequent robust control design applied to a wafer stage. A wafer stage is part of a wafer stepper and used in chip manufacturing processes for accurate positioning of the silicon wafer on which the chips are to be produced. Accurate and fast positioning requires a robust and high-performance multivariable servo controller that enables a fast throughput of silicon wafers. An advanced servo controller is developed by an iterative procedure of control-relevant model identification including model uncertainty bounding, and robust control based on worst-case performance optimisation. Both stability and performance robustness can be monitored, enabling the possibility of guaranteeing performance improvement in a single step of the iteration. This is shown to lead to a successful design and implementation on a wafer stage set-up.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 129.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 169.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2002 Springer-Verlag London

About this chapter

Cite this chapter

de Callafon, R.A., Van den Hof, P.M.J. (2002). Control-relevant Identification and Robust Motion Control of a Wafer Stage. In: Albertos, P., Sala, A. (eds) Iterative Identification and Control. Springer, London. https://doi.org/10.1007/978-1-4471-0205-2_12

Download citation

  • DOI: https://doi.org/10.1007/978-1-4471-0205-2_12

  • Publisher Name: Springer, London

  • Print ISBN: 978-1-4471-1098-9

  • Online ISBN: 978-1-4471-0205-2

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics