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Life-Cycle Assessment of Flash Memory

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Life-Cycle Assessment of Semiconductors
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Abstract

Solid state drives (SSD) show the potential for environmental benefits over magnetic data storage due to their lower power consumption. In this study, a complete life-cycle assessment (LCA) of flash memory over five technology generations (150 nm, 120 nm, 90 nm, 65 nm, and 45 nm) is presented to investigate this idea. The inventory of materials and energy used in NAND flash manufacturing is based on process data, while the impacts associated with chemicals, equipment, fab construction, electricity, and water are determined using economic input-output life-cycle analysis (EIO-LCA) and hybrid LCA. Sensitivity analysis shows that the most influential factors which can reduce the environmental impact of flash memory are perfluorinated compound (PFC) abatement in wafer fabrication and electricity use in manufacturing. A comparison between the complete life-cycle of 96 GB of flash memory and the use and transportation stages of a 2.5” hard disk drive (HDD) shows that the flash memory consumes less primary energy and water and results in lower global warming potential (GWP), ecotoxicity and smog formation than the magnetic HDD, though the relative benefit of flash-based SSD in other impact areas cannot be determined without a complete LCA of HDD.

Portions of this chapter are reprinted with permission from S. Boyd et al., Life-Cycle Assessment of NAND Flash Memory, IEEE Transactions on Semiconductor Manufacturing, February 2011. Copyright 2011 IEEE.

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References

  1. S. C. Bartos, N. Kshetry, and C. S. Burton. Modeling China’s semiconductor industry fluorinated compound emissions and drafting a roadmap for climate protection. International Journal of Greenhouse Gas Control, 2(4):665–676, Oct. 2008.

    Google Scholar 

  2. Carnegie Mellon University Green Design Institute. Economic Input-Output Life Cycle Assessment (EIO-LCA), US 1997 Industry Benchmark model, Economic Input-Output Life Cycle Assessment (EIO-LCA), US 1997 Industry Benchmark model. http://www.eiolca.net, accessed May 15, 2009.

  3. Y. Chen and R. Liu. Future trend of flash memories. In Memory Technology, Design and Testing, 2007. MTDT 2007. IEEE International Workshop on, pages 17–18, 2007.

    Google Scholar 

  4. EPA. The Emissions & Generation Resource Integrated Database for 2007 (eGrid2007), available online: www.epa.gov/cleanenergy/energy-resources/egrid/index.html. U.S. Environmental Protection Agency, September 2008.

  5. C. Facanha and A. Horvath. Evaluation of life cycle air emission factors of freight transportation. Environmental Science and Technology, 41(20):7138–7144, 2007.

    Google Scholar 

  6. IPCC. Climate Change 2007: The Physical Science Basis, Contribution of Working Group I to the Fourth Assessment Report of the Intergovernmental Panel on Climate Change. Cambridge University Press, Cambridge, UK and New York, NY, USA, 2007.

    Google Scholar 

  7. C. W. King and M. E. Webber. The water intensity of the Plugged-In automotive economy.Environmental Science & Technology, 42(12):4305–4311, June 2008.

    Google Scholar 

  8. N. Krishnan, S. Boyd, A. Somani, S. Raoux, D. Clark, and D. Dornfeld. A hybrid life cycle inventory of nano-scale semiconductor manufacturing.Environmental Science and Technology, 42(8):3069–3075, Apr. 2008.

    Google Scholar 

  9. G. A. Norris. Impact characterization in the tool for the reduction and assessment of chemical and other environmental impacts.J. Ind. Ecol., 6(3-4):79–99, 2003.

    Google Scholar 

  10. E. Pinheiro, W.-D. Weber, and L. A. Barroso. Failure trends in a large disk drive population. In Proceedings of the 5th USENIX Conference on File and Storage Technologies, 2007.

    Google Scholar 

  11. C. Reich-Weiser, T. Fletcher, D. Dornfeld, and S. Horne. Development of the supply chain optimization and planning for the environment (SCOPE) tool - applied to solar energy. In International Symposium on Electronics and the Environment. IEEE, 2008.

    Google Scholar 

  12. Sematech. The international technology roadmap for semiconductors: 2009, 2007, 2005, 2003, 2001, 1999 editions and 2010, 2008 and 2006 updates. Technical report, 1999–2010.

    Google Scholar 

  13. SIA.Annual Forecast of Global Semiconductor Sales. Semiconductor Industry Association, November 14 2007.

    Google Scholar 

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Correspondence to Sarah B. Boyd .

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Boyd, S.B. (2012). Life-Cycle Assessment of Flash Memory. In: Life-Cycle Assessment of Semiconductors. Springer, New York, NY. https://doi.org/10.1007/978-1-4419-9988-7_6

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  • DOI: https://doi.org/10.1007/978-1-4419-9988-7_6

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