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Long term condition monitoring of tapestries using image correlation

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Abstract

Digital Image Correlation (DIC) is used to extract non-contact full-field three-dimensional displacement and inplane strains from an historic tapestries. A DIC-based approach is devised that allows the effect of RH variations on a tapestry to be quantified. A historical tapestry has been monitored in a closely controlled environment and in the natural environment. The results revealed that very small variations in RH can have significant effects on strain. An automated long term monitoring approach has been devised to allow strain data to be extracted in real time from tapestries in remote locations. The results show that DIC provides better understanding of the effect of RH fluctuations on strain which will ultimately lead to more insight into the degradation process of historical tapestries. The paper demonstrates the potential for using DIC as a condition monitoring tool

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References

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  2. Howell, D., “Some mechanical effects of inappropriate humidity on textiles”, James and James, London, , ICOM-CC 11th Triennial Meeting, (1996),692-8

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  3. Khennouf, D., Dulieu-Barton, J.M., Chambers, A.R., Lennard, F.J. and Eastop, D.E., “Assessing the feasibility of monitoring strain in historical tapestries using Digital Image Correlation”, Strain, 2010, 46, 19-32. DOI: 10.1111/j.1475-1305.2009.00637.x

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© 2013 The Society for Experimental Mechanics, Inc.

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Dulieu-Barton, J.M., Khennouf, D., Chambers, A.R., Lennard, F.J., Eastop, D.D. (2013). Long term condition monitoring of tapestries using image correlation. In: Proulx, T. (eds) Application of Imaging Techniques to Mechanics of Materials and Structures, Volume 4. Conference Proceedings of the Society for Experimental Mechanics Series. Springer, New York, NY. https://doi.org/10.1007/978-1-4419-9796-8_43

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  • DOI: https://doi.org/10.1007/978-1-4419-9796-8_43

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  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4419-9528-5

  • Online ISBN: 978-1-4419-9796-8

  • eBook Packages: EngineeringEngineering (R0)

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