Abstract
In the following sections, both quantizers are compared in the presence of circuit nonidealities such as VCO nonlinearity, phase noise, and sampling clock jitter. These nonidealities are added to the VerilogA model, and theoretical equations are derived to verify the effects on each quantizer. Although the FDC has been widely adopted due to its inherent first-order noise shaping characteristic, the noise shaping is shown to degrade in the presence of phase noise and clock jitter. Other circuit nonidealities exist but are ignored in this analysis since these quantizers are highly digital circuits.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Takahashi M, Ogawa K, Kundert KS (1999) VCO jitter simulation and its comparison with measurement. In: Proceedings of the ASP-DAC 1999 Asia and South Pacific Design Automation Conference, 1999, Wanchai, 18–21 Jan 1999, pp 85–88
Poore R (2001) Phase noise and jitter. In: Agilent EEsof EDA. Overview of phase noise and jitter. Agilent Technologies, Inc.
Henrik F, Martin (2004) JITTER MANAGING 26/5-04. Electronic Devices, Department of Electrical Engineering, Linköping University, Sweden
Kim J et al (2010) Analysis and design of voltage-controlled oscillator based analog-to-digital converter. IEEE Trans Circ Syst I: Reg Pap 57(1):18–30
Farjad-Rad R et al (2002) A 0.2-2 GHz 12 mW multiplying DLL for low-jitter clock synthesis in highly-integrated data communication chips. In: 2002 IEEE International Solid-State Circuits Conference (ISSCC), Digest of Technical Papers, San Francisco, CA, 3–7 Feb 2002, vol 1, pp 76–77
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2011 Springer Science+Business Media, LLC
About this chapter
Cite this chapter
Yoder, S., Ismail, M., Khalil, W. (2011). Limitations of the VCO-Based Quantizer. In: VCO-Based Quantizers Using Frequency-to-Digital and Time-to-Digital Converters. SpringerBriefs in Electrical and Computer Engineering(). Springer, New York, NY. https://doi.org/10.1007/978-1-4419-9722-7_3
Download citation
DOI: https://doi.org/10.1007/978-1-4419-9722-7_3
Published:
Publisher Name: Springer, New York, NY
Print ISBN: 978-1-4419-9721-0
Online ISBN: 978-1-4419-9722-7
eBook Packages: EngineeringEngineering (R0)