Abstract
As it was mentioned before, the recent advancements in IR remote sensing became possible due to successful development of high quality photo-detecting devices at the wavelengths of atmospheric transparency. For instance, originally the high sensitivity photo-detecting devices (D* ≥ 1010 - 1011 cmHz 1/2/W) for the spectral range up to 5 µm were produced with PbS, PbSe, and PbTe materials and later using InSb and InAs (Fig. 3). However, due to the progress in laser communications technology, it became necessary to introduce the avalanche photo-detectors on the basis of Si (λm ≈ 1.02 µm) and In x Ga1-x As (λ = 0.8 — 0.9 µm, (λm = 13 - 6 µm [32, 71]) to support the increased demands in bandwidth capacity.
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© 2004 Springer Science+Business Media New York
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Abrahamian, Y., Martirossyan, R., Gasparyan, F., Kocharyan, K. (2004). Growing Technology and Electro-Physical Characteristics of Solid Solutions PbSnTe, PbSnSe and CdHdTe . In: Kocharyan, K. (eds) Methods and Materials for Remote Sensing. Springer, Boston, MA. https://doi.org/10.1007/978-1-4419-9025-9_3
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DOI: https://doi.org/10.1007/978-1-4419-9025-9_3
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