Systematic Study of Electron and Positron Collisions with Perfluorocarbons C4F8, cyclo-C4F8 and C4F10

Abstract

Total cross section (TCS) measurements for 0.4–1000eV electron and 0.2–1000eV positron collisions have been studied for C4F8, cyclo-C4F8 and C4F10 molecules in a linear time-of-flight apparatus. Electron TCSs for all molecules show strong enhancements, which may be due to the temporary-negative-ion resonances observed in another systematic study of perfluorocarbons by Sanabia et al. Positron TCSs, on the other hand, show no conspicuous structures but have TCS magnitudes that increase with increase in molecular size.

Keywords

Toxicity Perfluorocarbon Ectron Fluorobutane 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    L. G. Christophorou, J. K. Olthoff and M. V. V. S. Rao, Electron interactions with CF4, Phys. Chem. Ref Data 25(5), 1341–1388 (1996).ADSCrossRefGoogle Scholar
  2. 2.
    J. E. Sanabia, G. D. Cooper, J. A. Tossell, and J. H. Moore, Total electron-scattering cross sections for CHF3, C2F6, C3F8, and c-C4F8, J. Chem. Phys. 108(2), 389–391 (1998).ADSCrossRefGoogle Scholar
  3. 3.
    H. Nishimura, Total electron scattering cross sections for c-C4F8, in Book of Abstracts of the International Symposium on Electron-Molecule Collisions and Swarms, Tokyo, 18–20 July 1999, p. 103–104.Google Scholar
  4. 4.
    G. I. Font, W. L. Morgan, and G. Mennenga, Cross-section set and chemistry model for the simulation of c-C4F8 plasma discharges, J. Appl. Phys. 91(6), 3530–3538 (2002).ADSCrossRefGoogle Scholar
  5. 5.
    H. Toyoda, M. Iio and, H. Sugai, Cross section measurements for electron-impact dissociation of C4F10 into neutral and ionic radicals, Jpn. J. Appl. Phys. 36(6A), 3730–3735 (1997).ADSCrossRefGoogle Scholar
  6. 5.
    S. R. Hunter and L. G. Christophorou, Electron attachment to the perfluoroalkanes n-CNF2N+12(N=1–6) using high pressure swarm techniques, J. Chem. Phys. 80(12), 6150–6164 (1984).ADSCrossRefGoogle Scholar
  7. 6.
    O. Sueoka, S. Mori and A. Hamada, Total cross sections for positrons and electrons colliding with molecules: I. SiH4 and CF4, J. Phys. B 27, 1453–1465 (1994).ADSCrossRefGoogle Scholar
  8. 7.
    R. E. Kennerly and R. A. Bonham, Electron-helium absolute total scattering cross sections from 0.5 to 50 eV, Phys. Rev. A 17(6), 1844–1854 (1978).ADSCrossRefGoogle Scholar
  9. 8.
    A. A. Christodoulides, L. G. Christophorou, R. Y. Pai and C. M. Tung, Electron attachment to perfluorocarbon compounds. I. c-C4F6, 2-C4F6, 1,3-C4F6, c-C4F8 and 2-C4F8, J. Chem. Phys. 70(3), 1156–1168 (1979).ADSCrossRefGoogle Scholar
  10. 9.
    A. Chutjian and S. H. Alajajian, Measurements of electron attachment lineshapes and cross sections at ultra-low electron energies for CF2CI2, c-C4F6, c-C4F8 and c-C7F14. J. Phys. B 20(4), 839–846 (1987).ADSCrossRefGoogle Scholar
  11. 10.
    T. M. Miller, R. A. Morris, A. E. S. Miller, A. A. Viggiano and J. F. Paulson, Observation of thermal electron detachment from cyclo-C4F8 in FALP experiments, Int. J. Mass Spectrom. Ion Processes 135(2–3), 195–205 (1994).ADSCrossRefGoogle Scholar
  12. 11.
    I. Ishii, R. McLaren, A. P. Hitchcock, K. D. Jordan, Y. Choi and M. B. Robin, Can. J. Chem. 66, 2104 (1988).CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 2004

Authors and Affiliations

  1. 1.Graduate School of Science and EngineeringYamaguchi UniversityYamaguchiJapan

Personalised recommendations