Skip to main content

High Spectral Resolution X-Ray Imaging Crystal Spectrometer for Tokamaks and Stellarators

  • Chapter

Abstract

High resolution x-ray spectroscopy is frequently being used for the measurement of basic plasma parameters in high temperature plasmas. These include measurements of the ion and electron temperature, the plasma motion and the abundance of different charge states. Early experiments have been done on PLT and TFR, and more recently on TFTR, JET, JT60, LHD, W7-AS, TORE SUPRA, ALCATOR-C-MOD, TEXTOR and NSTX.

This is a preview of subscription content, log in via an institution.

Buying options

Chapter
USD   29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD   129.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD   169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD   169.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Learn about institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Weinheimer, J., I. Ahmad, O. Herzog, and H.-J. Kunze, G. Bertschinger and W. Biel, G. Borchert, M. Bitter, Rev. Sci. Instrum.72, 2566–2574 (2001)

    Article  ADS  Google Scholar 

  2. Bertschinger, G., W. Biel, the TEXTOR-94 Team, O. Herzog, J. Weinheimer, H.-J. Kunze and M. Bitter, Physica Scripta. T83, 132–141 (1999)

    Article  ADS  Google Scholar 

  3. B. L. Henke, E. M. Gullikson, and J. C. Davis. Atomic Data and Nuclear Data Tables Vol. 54(no.2), 181–342 (July1993). http://www-cxro.lbl.gOv/optical_constants

    Article  ADS  Google Scholar 

  4. S. Stepanov, http://sergey.bio.aps.anl.gov/xOh.html

  5. B. Fraenkel, M. Bitter, S. von Goeler, and K. W. Hill, J. X-Ray Sci. Technol.7, 171 (1997)

    Google Scholar 

  6. F. Cerrina, B. Lai, K. Chapman, C. Welnak, P. Runkle, http://www.nanotech.wisc.edu/shadow/

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2002 Springer Science+Business Media New York

About this chapter

Cite this chapter

Bertschinger, G., Bitter, M., Rusbüldt, D. (2002). High Spectral Resolution X-Ray Imaging Crystal Spectrometer for Tokamaks and Stellarators. In: Stott, P.E., Wootton, A., Gorini, G., Sindoni, E., Batani, D. (eds) Advanced Diagnostics for Magnetic and Inertial Fusion. Springer, Boston, MA. https://doi.org/10.1007/978-1-4419-8696-2_50

Download citation

  • DOI: https://doi.org/10.1007/978-1-4419-8696-2_50

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4613-4669-2

  • Online ISBN: 978-1-4419-8696-2

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics