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Introduction to Diagnosis

  • Mohammad Tehranipoor
  • Ke Peng
  • Krishnendu Chakrabarty
Chapter

Abstract

The test techniques are used to determine whether a circuit is faulty, which are necessary to ensure the correct operation of digital systems. However, these techniques may not be able to locate the failure in the faulty circuits. Once a circuit is found to be faulty, fault diagnosis is needed to identify the fault location. Fault diagnosis refers to the process of narrowing down the possible locations of the defects, and finally locating the defects in faulty integrated circuits. The aim of the diagnosis process is to identify a subset of faults that can explain all the failures or errors observed when applying test patterns to the chip. In the process of searching for the failure root causes, the diagnosis procedure can reduce the candidate locations down to only a few possibilities. Therefore, it is very helpful to ramp up the manufacturing yield and reduce the debugging time. Fault diagnosis may also be helpful in identifying and replacing the faulty sub-circuit in a chip. This chapter introduces the basic concepts and algorithms for diagnosing combinational circuits, scan chains, as well as chip-level diagnosis. When diagnosing the combinational circuits, it is assumed that the scan chains are fault-free. Following that, this chapter discusses the challenges and methodologies of scan chain and chip-level diagnosis.

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Copyright information

© Springer Science+Business Media, LLC 2011

Authors and Affiliations

  • Mohammad Tehranipoor
    • 1
  • Ke Peng
    • 2
  • Krishnendu Chakrabarty
    • 3
  1. 1.ECE DepartmentUniversity of ConnecticutStorrsUSA
  2. 2.Freescale SemiconductorMicrocontroller Solutions GroupAustinUSA
  3. 3.ECE DepartmentDuke UniversityDurhamUSA

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