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System-Level Considerations

  • Niccolò Battezzati
  • Luca Sterpone
  • Massimo Violante
Chapter

Abstract

In the previous chapters we presented the impact of ionizing radiation on FPGA devices; we discussed the possible mitigation techniques looking at both the FPGA manufacturer point of view and the FPGA user point of view; we also presented experimental data about reprogrammable FPGAs available on the market; and we discussed the use of application-level techniques to mitigate ionizing radiation effects on several case studies.

Keywords

Field Programmable Gate Array Solar Energetic Particle Linear Energy Transfer Target Application Soft Error 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    Naval Research Laboratory, creme96.nrl.navy.mil. 1996, September, 2010.Google Scholar
  2. 2.
    P.S. Ostler, M.P. Caffrey, D.S. Gibelyou, P.S. Graham, K.S. Morgan, B.H. Pratt, H.M. Quinn, and M.J. Wirthlin, Sram fpga reliability analysis for harshradiation environments, IEEE Transactions on Nuclear Science 56 (2009), no. 6, 3519–3526.CrossRefGoogle Scholar
  3. 3.
    Xilinx Application Notes, Platform flash in-system programmable configuration proms, San Jose, 2010.Google Scholar

Copyright information

© Springer Science+Business Media, LLC 2011

Authors and Affiliations

  • Niccolò Battezzati
    • 1
  • Luca Sterpone
    • 2
  • Massimo Violante
    • 1
  1. 1.Dipto. Automatica e InformaticaPolitecnico di TorinoTorinoItaly
  2. 2.Politecnico di TorinoTorinoItaly

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