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Digital System Test and Testable Design pp 175–212Cite as

Deterministic Test Generation Algorithms

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Abstract

The previous chapter provided an understanding of test generation and showed where and how test generation is used in digital system testing.

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Authors and Affiliations

  1. Department of Electrical & Computer Engineering, Worcester Polytechnic Institute, Worcester, MA, USA

    Zainalabedin Navabi

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  1. Zainalabedin Navabi
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Correspondence to Zainalabedin Navabi .

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© 2011 Springer Science+Business Media, LLC

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Navabi, Z. (2011). Deterministic Test Generation Algorithms. In: Digital System Test and Testable Design. Springer, Boston, MA. https://doi.org/10.1007/978-1-4419-7548-5_6

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  • DOI: https://doi.org/10.1007/978-1-4419-7548-5_6

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  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4419-7547-8

  • Online ISBN: 978-1-4419-7548-5

  • eBook Packages: EngineeringEngineering (R0)

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