X-Ray Energy-Dispersive Spectrometry in Scanning Transmission Electron Microscopes

  • Masashi Watanabe


Recently developed aberration correctors have brought significant improvements in materials characterization. In aberration-corrected scanning transmission electron microscopy (STEM), the incident probe dimensions can be refined significantly, and image resolution has already reached sub-angstrom levels in high-angle annular dark-field (HAADF) STEM imaging (Batson et al. 2002, Nellist et al. 2004). In addition, materials characterization at the atomic level can routinely be performed by electron energy-loss spectrometry (EELS) in aberration-corrected STEM (e.g. Varela et al. 2005). The aberration correction of the incident beam is also very useful for X-ray energy-dispersive spectrometry (XEDS) because the spatial resolution can be dramatically improved with the refined probe (Watanabe et al. 2006).


Grain Boundary Scanning Transmission Electron Microscopy Spectrum Imaging Chromatic Aberration Atom Probe Tomography 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.



The author wishes to acknowledge the support of the National Science Foundation (grant DMR-0804528) and Bechtel Bettis, Inc. The author would also like to thank Prof. David Williams (currently at the Univ. of Alabama, Huntsville) for his thoughtful supervision for many years. In collaboration with Prof. Williams, the ζ-factor method and MSA plug-ins were developed. In addition, the author would like to thank Prof. Christopher Kiely, Mr. David Ackland and colleagues at Lehigh, Prof. Zenji Horita at Kyushu University, Dr. Ulrich Dahmen and colleague at National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Dr. Vicki Keast at Univ. Newcastle, Dr. Michel Bosman at Institute of Microelectronics, Dr. Kazuo Ishizuka and Mr. Kenta Yoshimura at HREM Research, Inc., Dr. Hidetaka Sawada, Mr. Eiji Okunishi and Mr. Masahiko Kanno at JEOL, Mr. Shintaro Yazuka, Mr. Toshihiro Aoki, Mr. Toshihiro Nomura, Dr. Masahiro Kawasaki, and Dr. Tom Isabell at JEOL USA, and Dr. Toshie Yaguchi at Hitachi Hitechnologies for their collaboration.


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© Springer Science+Business Media, LLC 2011

Authors and Affiliations

  1. 1.Department of Materials Science and EngineeringLehigh UniversityBethlehemUSA

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