Simulation and Interpretation of Images

  • Leslie J. Allen
  • Scott D. Findlay
  • Mark P. Oxley


In this chapter we discuss the simulation and interpretation of both Z-contrast and electron energy-loss spectroscopy images in scanning transmission electron microscopy.


Scanning Transmission Electron Microscopy Bloch Wave Conventional Transmission Electron Microscopy Scanning Transmission Electron Microscopy Image Carbon Column 



L. J. Allen acknowledges support by the Australian Research Council. S. D. Findlay is supported by the Japanese Society for the Promotion of Science (JSPS). M.P. Oxley was supported by the Office of Basic Energy Sciences, Materials Sciences and Engineering Division, U.S. Department of Energy. We would like to thank our following collaborators for their considerable inputs into various parts of the work summarized in this chapter: G. Behan, A. L. Bleloch, M. Bosman, E. C. Cosgriff, A. J. D’Alfonso, C. Dwyer, J. L. García-Muñoz, V. J. Keast, A. I. Kirkland, J. M. LeBeau, P. D. Nellist, S. Stemmer and P. Wang.


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Copyright information

© Springer Science+Business Media, LLC 2011

Authors and Affiliations

  • Leslie J. Allen
    • 1
  • Scott D. Findlay
    • 2
  • Mark P. Oxley
    • 3
    • 4
  1. 1.School of PhysicsUniversity of MelbourneMelbourneAustralia
  2. 2.Institute of Engineering InnovationThe University of TokyoTokyoJapan
  3. 3.Department of Physics and AstronomyVanderbilt UniversityNashvilleUSA
  4. 4.Materials Science and Technology DivisionOak Ridge National LaboratoryOak RidgeUSA

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