Dynamic Nanomechanical Characterization Using Multiple-Frequency Method



Macroscopic behavior of materials, whether synthetic or biological, depends on the morphology and characteristics of their microscopic constituents. Improving the performance of engineered materials and understanding the design principles of biomaterials demand tools that can characterize material properties with nanoscale resolution. What is the spatial arrangement of the components of a heterogeneous material? Are the material properties of those components different from their respective bulk properties? How do material properties change near the interfaces? What is the influence of temperature, electric or magnetic fields, or solvents? Answering these questions is of critical importance to the rational design of advanced materials and to the analysis of biological materials. In this chapter, we focus on the recent advances in the measurement and characterization of dynamic nanomechanical properties with high spatial resolution using specially designed atomic force microscope cantilevers. We will first describe the basic operation principles of this method and present results to judge its performance on various material systems.


Elastic Modulus Torsional Vibration Torsional Mode Elastic Modulus Measurement Torsional Resonance 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


  1. 1.
    R. Garcia and R. Perez, “Dynamic atomic force microscopy methods,” Surf. Sci. Rep. 47 197–301 (2002).CrossRefGoogle Scholar
  2. 2.
    J. Israelachvili, Intermolecular and Surface Forces. (Academic Press, London, 2003).Google Scholar
  3. 3.
    O. Sahin, “Accessing time-varying forces on the vibrating tip of the dynamic atomic force microscope to map material composition,” Israel J. Chem. 48 55–63 (2008).CrossRefGoogle Scholar
  4. 4.
    R. W. Stark and W. M. Heckl, “Fourier transformed atomic force microscopy:tapping mode atomic force microscopy beyond the Hookian approximation,” Surf. Sci. 457 219–228 (2000).CrossRefGoogle Scholar
  5. 5.
    M. Stark, R. W. Stark, W. M. Heckl et al., “Inverting dynamic force microscopy:From signals to time-resolved interaction forces,” Proc. Natl. Acad. Sci. U.S.A. 99 8473–8478 (2002).CrossRefGoogle Scholar
  6. 6.
    U. Rabe, K. Janser, and W. Arnold, “Vibrations of free and surface-coupled atomic force microscope cantilevers:Theory and experiment,” Rev. Sci. Instrum. 67 3281–3293 (1996).CrossRefGoogle Scholar
  7. 7.
    J. Tamayo and R. Garcia, “Deformation, contact time, and phase contrast in tapping mode scanning force microscopy,” Langmuir 12 4430–4435 (1996).CrossRefGoogle Scholar
  8. 8.
    R. W. Stark, “Optical lever detection in higher eigenmode dynamic atomic force microscopy,” Rev. Sci. Instrum. 75 5053–5055 (2004).CrossRefGoogle Scholar
  9. 9.
    O. Sahin, S. Magonov, C. Su et al., “An atomic force microscope tip designed to measure time-varying nanomechanical forces,” Nat. Nanotechnol. 2 507–514 (2007).CrossRefGoogle Scholar
  10. 10.
    O. Sahin and N. Erina, “High-resolution and large dynamic range nanomechanical mapping in tapping-mode atomic force microscopy,” Nanotechnology 19 445717 9 (2008).CrossRefGoogle Scholar
  11. 11.
    J. P. Cleveland, B. Anczykowski, A. E. Schmid et al., “Energy dissipation in tapping-mode atomic force microscopy,” Appl. Phys. Lett. 72 2613–2615 (1998).CrossRefGoogle Scholar
  12. 12.
    L. Zitzler, S. Herminghaus, and F. Mugele, “Capillary forces in tapping mode atomic force microscopy,” Phys. Rev. B 66 155436 8 (2002).CrossRefGoogle Scholar
  13. 13.
    D. Klinov and S. Magonov, “True molecular resolution in tapping-mode atomic force microscopy with high-resolution probes,” Appl. Phys. Lett. 84 2697–2699 (2004).CrossRefGoogle Scholar
  14. 14.
    S. De Feyter and F. C. De Schryver, “Two-dimensional supramolecular self-assembly probed by scanning tunneling microscopy,” Chem. Soc. Rev. 32 139–150 (2003).CrossRefGoogle Scholar
  15. 15.
    I. M. Ward, An Introduction to the Mechanical Properties of Solid Polymers. (Wiley, Chichester, UK, 2004).Google Scholar

Copyright information

© Springer Science+Business Media, LLC 2010

Authors and Affiliations

  1. 1.The Rowland Institute at HarvardCambridgeUSA

Personalised recommendations