New Capabilities at the Interface of X-Rays and Scanning Tunneling Microscopy

  • Volker Rose
  • John W. Freeland
  • Stephen K. Streiffer
Chapter

Abstract

The achievement of nanometer spatial resolution with direct elemental selectivity would have a tremendous impact on our ability to probe and understand complex phenomena occurring at the nanoscale. The combination of synchrotron-based X-ray spectroscopy with the high spatial resolution of scanning tunneling microscopy (STM) has the potential to help attain this goal. In this chapter we show how synchrotron X-ray-enhanced scanning tunneling microscopy (SXSTM) has evolved from the very early days of photo-assisted STM to become a promising spectroscopy and imaging technique in nanoscience and nanotechnology. The basic principles of SXSTM are discussed accompanied by a presentation of recent experiments.

Copyright information

© Springer Science+Business Media, LLC 2010

Authors and Affiliations

  • Volker Rose
    • 1
  • John W. Freeland
  • Stephen K. Streiffer
  1. 1.Advanced Photon Source Argonne National LaboratoryArgonneUSA

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