Abstract
This chapter introduces the structural background of the appearance of polar nanoregions in relaxors, describes their major macroscopic dielectric and ferroelectric properties, and presents the results of recent investigations of local polar structures by piezoresponse force microscopy (PFM). Statistical analysis of observed nanodomains, their temperature evolution, and polarization switching results are given for several relaxor families based on Sr x Ba1–x Nb2O6 (SBN), PbMg1/3Nb2/3O3 (PMN), PbZn1/3Nb2/3O3 (PZN), and (Pb1–x La x )(Zr1–y Ti y )O3 (PLZT). The PFM technique has proved to be a powerful tool for the investigation of local properties of relaxors where optical techniques obviously fail because of their lack of resolution. In addition, size- and grain boundary-dependent phenomena in relaxors are reviewed for representative PLZT compositions. Examples of investigations of polar structures in relaxor films and ceramics and single are also presented.
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Acknowledgments
Intense cooperation on SBN-type relaxor materials with Prof. J. Dec, University of Silesia, Katowice, Poland, is gratefully acknowledged. The work of V.V. Shvartsman has partly been supported by the EU STREP “MULTICERAL.” D.A. Kiselev is grateful to the Foundation for Science and Technology of Portugal for the financial support (SFRH/BD/22391/2005). The work of the Portuguese co-authors is partly supported by the project PTDC/FIS/81442/2006.
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Shvartsman, V.V., Kleemann, W., Kiselev, D.A., Bdikin, I.K., Kholkin, A.L. (2010). Polar Structures in Relaxors by Piezoresponse Force Microscopy. In: Kalinin, S., Gruverman, A. (eds) Scanning Probe Microscopy of Functional Materials. Springer, New York, NY. https://doi.org/10.1007/978-1-4419-7167-8_12
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