JEDEC Standards on Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray Induced Soft Errors

Part of the Frontiers in Electronic Testing book series (FRET, volume 41)


While the history of soft errors in commercial semiconductor devices spans over three decades, it has only been relatively recently that specifications have been created to standardize the characterization of the effects of alpha particles and neutrons on ICs. Some of the first standards developed for devices used in commercial applications come from one of the premier semiconductor industry standards body, JEDEC, formerly known as Joint Electron Device Engineering Council. The JEDEC JESD89 standards are now widely referenced in most technical publications on soft errors in commercial ICs. This chapter gives an overview of the JEDEC JESD89 series of standards, describes the technical background for their development and details the areas for future improvement.


Neutron Flux Thermal Neutron Alpha Particle Neutron Spectrum Thermal Neutron Flux 
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Copyright information

© Springer Science+Business Media, LLC 2011

Authors and Affiliations

  1. 1.Ops La CarteSanta ClaraUSA

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