JEDEC Standards on Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray Induced Soft Errors
While the history of soft errors in commercial semiconductor devices spans over three decades, it has only been relatively recently that specifications have been created to standardize the characterization of the effects of alpha particles and neutrons on ICs. Some of the first standards developed for devices used in commercial applications come from one of the premier semiconductor industry standards body, JEDEC, formerly known as Joint Electron Device Engineering Council. The JEDEC JESD89 standards are now widely referenced in most technical publications on soft errors in commercial ICs. This chapter gives an overview of the JEDEC JESD89 series of standards, describes the technical background for their development and details the areas for future improvement.
KeywordsNeutron Flux Thermal Neutron Alpha Particle Neutron Spectrum Thermal Neutron Flux
- 2.JEDEC Online Resource Guide at www.jedec.org.
- 3.T.C May and M.H. Woods, “A new physical mechanism for soft-errors in dynamic memories”, Proc.16th Annual Reliability Physics Symp, Apr. 1978, pp. 33–402.Google Scholar
- 6.J.F. Ziegler, “SRIM 2003,” Nucl. Instrum. Methods, vol. 219–220, pp. 1027–1036, 2004.Google Scholar
- 7.K.M. Warren, J.D. Wilkinson, R.A. Weller, B.D. Sierawski, R.A. Reed, M.E. Porter, M.H. Mendenhall, R.D. Schrimpf, and L.W. Massengill, “Predicting neutron induced soft error rates: Evaluation of accelerated ground based test methods”, IEEE 46th Annual International Reliability Physics Symposium, Phoenix AZ, May 2008, pp. 473–477.Google Scholar
- 9.ASTM E262-03 Standard method for determining thermal neutron reaction and fluence rates by radioactivation techniques.Google Scholar