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JEDEC Standards on Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray Induced Soft Errors

  • Charles Slayman
Chapter
Part of the Frontiers in Electronic Testing book series (FRET, volume 41)

Abstract

While the history of soft errors in commercial semiconductor devices spans over three decades, it has only been relatively recently that specifications have been created to standardize the characterization of the effects of alpha particles and neutrons on ICs. Some of the first standards developed for devices used in commercial applications come from one of the premier semiconductor industry standards body, JEDEC, formerly known as Joint Electron Device Engineering Council. The JEDEC JESD89 standards are now widely referenced in most technical publications on soft errors in commercial ICs. This chapter gives an overview of the JEDEC JESD89 series of standards, describes the technical background for their development and details the areas for future improvement.

Keywords

Neutron Flux Thermal Neutron Alpha Particle Neutron Spectrum Thermal Neutron Flux 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

References

  1. 1.
  2. 2.
    JEDEC Online Resource Guide at www.jedec.org.
  3. 3.
    T.C May and M.H. Woods, “A new physical mechanism for soft-errors in dynamic memories”, Proc.16th Annual Reliability Physics Symp, Apr. 1978, pp. 33–402.Google Scholar
  4. 4.
    T.C. May and M.H. Woods, “Alpha-particle-induced soft error in dynamic memories”, IEEE Trans. Electron Devices, vol. 26, no. 1, pp. 2–9, Jan. 1979.CrossRefGoogle Scholar
  5. 5.
    C.S. Guenzer, E.A. Wolicki, and R.G. Allas, “Single event upset of dynamic RAMs by neutrons, protons”, IEEE Trans. Nucl. Sci., vol. 26, pp. 5048–5052, Dec. 1979.CrossRefGoogle Scholar
  6. 6.
    J.F. Ziegler, “SRIM 2003,” Nucl. Instrum. Methods, vol. 219–220, pp. 1027–1036, 2004.Google Scholar
  7. 7.
    K.M. Warren, J.D. Wilkinson, R.A. Weller, B.D. Sierawski, R.A. Reed, M.E. Porter, M.H. Mendenhall, R.D. Schrimpf, and L.W. Massengill, “Predicting neutron induced soft error rates: Evaluation of accelerated ground based test methods”, IEEE 46th Annual International Reliability Physics Symposium, Phoenix AZ, May 2008, pp. 473–477.Google Scholar
  8. 8.
    M.S. Gordon, P. Goldhagen, K.P. Rodbell, T.H. Zabel, H.H.K. Tang, J.M. Clem, and P. Bailey, “Measurement of the flux and energy spectrum of cosmic-ray induced neutrons on the ground”, IEEE Trans Nucl. Sci., vol. 51, no. 6, pp. 3427–3434, Dec. 2004.CrossRefGoogle Scholar
  9. 9.
    ASTM E262-03 Standard method for determining thermal neutron reaction and fluence rates by radioactivation techniques.Google Scholar
  10. 10.
    A. Dixit, R. Heald, and A. Wood, “Trends from ten years of soft error experimentation”, IEEE Workshop on Silicon Errors in Logic – System Effects, Stanford Univ, CA, March 24–25, 2009. Available online at www.selse.org/Papers/selse5_submission_29.pdf.Google Scholar

Copyright information

© Springer Science+Business Media, LLC 2011

Authors and Affiliations

  1. 1.Ops La CarteSanta ClaraUSA

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