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Single Event Effects: Mechanisms and Classification

  • Rémi Gaillard
Chapter
Part of the Frontiers in Electronic Testing book series (FRET, volume 41)

Abstract

Single Event Effects (SEEs) induced by heavy ions, protons, and neutrons become an increasing limitation of the reliability of electronic components, circuits, and systems, and have stimulated abundant past and undergoing work for improving our understanding and developing mitigation techniques. Therefore, compiling the knowledge cumulated in an abundant literature, and reporting the open issues and ongoing efforts, is a challenging task. Such a tentative should start by discussing the fundamental aspects of SEEs before reviewing the different steps that are necessary for creating comprehensive prediction models and developing efficient mitigation techniques.

Keywords

Alpha Particle Bipolar Transistor Soft Error Critical Charge Single Event Transient 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media, LLC 2011

Authors and Affiliations

  1. 1.Saint-Arnoult on YvelinesFrance

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