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Process Variations and Probabilistic Integrated Circuit Design pp 181–213Cite as

Consequences for Circuit Design and Case Studies

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Abstract

The previous chapters introduced various methods to analyze the influence of variations of the manufacturing process on the performance of devices and circuits. These methods can be applied to evaluate designs for manufacturability. Variations imply negative effects in most cases that shall be reduced. However, there exist also applications where the variations bring an advantage into the design process. The consequences of both aspects regarding special design requirements will be figured out in this chapter.

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Notes

  1. 1.

    For more information, see note concerning “Square-Root Law” on page 56.

  2. 2.

    Integral nonlinearity

  3. 3.

    Differential nonlinearity

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Authors and Affiliations

  1. IBM Corporation, 2070 Route 52, Hopewell Junction, NY, 12533, USA

    Alyssa C. Bonnoit

  2. IPGEN Microelectronics GmbH, Kortumstr. 36, 44787, Bochum, Germany

    Reimund Wittmann

Authors
  1. Alyssa C. Bonnoit
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  2. Reimund Wittmann
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Correspondence to Alyssa C. Bonnoit .

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Editors and Affiliations

  1. Integrierte Schaltungen, Institutsteil Entwurfsautomatisierung, Fraunhofer -Institut fur, Zeunerstr. 38, Dresden, 01069, Germany

    Manfred Dietrich

  2. Integrierte Schaltungen, Institutsteil Entwurfsautomatisierung, Fraunhofer -Institut fur, Zeunerstr. 38, Dresden, 01069, Germany

    Joachim Haase

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Bonnoit, A.C., Wittmann, R. (2012). Consequences for Circuit Design and Case Studies. In: Dietrich, M., Haase, J. (eds) Process Variations and Probabilistic Integrated Circuit Design. Springer, New York, NY. https://doi.org/10.1007/978-1-4419-6621-6_5

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  • DOI: https://doi.org/10.1007/978-1-4419-6621-6_5

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  • Online ISBN: 978-1-4419-6621-6

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