The Transmission Electron Microscope

  • Earl J. Kirkland


This chapter gives a short description of the physical instrumentation of the transmission electron microscope (fixed beam and scanning modes). It starts with the fundamental physics of electron dynamics for energies in the range 100–1000 keV. Some types of magnetic lenses and aberration correctors used to focus the electrons in the microscope are discussed. Various approximation used in modeling the microscope are introduced. Optical aberrations are defined, and general methods of aberration correction are described briefly.


Objective Lens Spherical Aberration Optical Aberration Glass Lens Aberration Corrector 
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Further Reading

Some Books on Electron Microscopy

  1. P. R. Buseck, J. M. Cowley and L. Eyring, edit., High-Resolution Transmission Electron Microscopy, Oxford Univ. Press, 1988 [43]Google Scholar
  2. J. J. Bozzola and L. D. Russell, Electron Microscopy, Princ. and Tech. for Biologists, 2nd edit., Jones and Bartlett Pub., 1999 [36]Google Scholar
  3. D. K. Bowen and C. R. Hall, Microscopy of Materials, MacMillan Press, 1975 [35]Google Scholar
  4. M. DeGraf, Intro. to Conventional Transmission Electron Microscopy, Cambridge Univ. Press, 2003 [129]Google Scholar
  5. J. W. Edington, Practical Electron Microscopy in Materials Science, Van Nostrand Reinhold, 1976 [87]Google Scholar
  6. B. Fultz and J. Howe, Transmission Electron Microscopy and Diffractometry of Materials, Springer, 2001 [120]Google Scholar
  7. C. E. Hall, Introduction to Electron Microscopy, 2nd edition, McGraw-Hill, 1966 [141]Google Scholar
  8. P. W. Hawkes, Electron Optics and the Electron Microscope, Taylor and Francis, 1972 [148]Google Scholar
  9. R. D. Heidenreich, Fundamentals of Transmission Electron Microscopy, Wiley, 1964 [154]Google Scholar
  10. P. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley, M. J. Whelan, Electron Microscopy of Thin Crystals, second edition, Krieger, 1977 [159]Google Scholar
  11. S. Horiuchi, Fundamentals of High Resolution Transmission Electron Microscopy, North-Holland, 1994 [161]Google Scholar
  12. R. Keyse et al., Intro. to Scanning Transmission Electron Microscopy, Springer, 1998 [193]Google Scholar
  13. G. A. Meek, Practical Electron Microscopy for Biologists, second edition, Wiley, 1976 [240]Google Scholar
  14. L. Reimer, Transmission Electron Microscopy, third edition, Springer-Verlag, 1993 [295]Google Scholar
  15. L. Reimer, Scanning Electron Microscopy, Springer-Verlag, 1985 [294]Google Scholar
  16. J. C. H. Spence, Experimental High-Resolution Electron Microscopy, Oxford University Press, 2003 [330]Google Scholar
  17. D. B. Williams and C. B. Carter, Transmission Electron Microscopy, A Textbook for Materials Science, Plenum Press, 1996 [380]Google Scholar

Some Books on Electron Optics

  1. P. Grivet, Electron Optics, Parts 1 and 2, 2nd english edition, Pergamon, 1972 [135]Google Scholar
  2. P. W. Hawkes and E. Kasper, Principles of Electron Optics, Vol. 1, 2, 3, Academic Press, 1989, 1994 [151,152,153]Google Scholar
  3. P. W. Hawkes (edit.), Aberration-corrected Electron Microscopy, Adv. Imag. and Elect. Phys., vol. 153, Academic Press, 2008 [150]Google Scholar
  4. O. Klemperer and M. E. Barnett, Electron Optics, third edition, Cambridge Univ. Press, 1971 [212]Google Scholar
  5. A. B. El-Kareh and J. C. J. El-Kareh, Electron Beams, Lenses, and Optics, Vol.1,2, Academic Press, 1970 [91]Google Scholar
  6. J. Orloff, Handbook of Charged Particle Optics, 2nd edit., CRC Press, 2009 [276]Google Scholar
  7. A. Septier, editor, Applied Charged Particle Optics, in: Adv. in Electronics and Electron Physics, Vol. 13A, B, Academic Press, 1980 [317]Google Scholar
  8. V. K. Zworykin, G. A. Morton, E. G. Ramberg, J. Hillier, A. W. Vance, Electron Optics and the Electron Microscope, Wiley, 1945 [394]Google Scholar

Copyright information

© Springer Science+Business Media, LLC 2010

Authors and Affiliations

  1. 1.School of Applied and Engineering PhysicsCornell UniversityIthacaUSA

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