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Advanced Computing in Electron Microscopy pp 241–242Cite as

The Fourier Projection Theorem

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Abstract

This appendix derives a property of a two-dimensional Fourier transform that can be used to generate the projected atomic potential in two dimensions of a three-dimensional atomic potential.

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Authors and Affiliations

  1. School of Applied and Engineering Physics, Cornell University, 212 Clark Hall, Ithaca, NY, 14853, USA

    Earl J. Kirkland

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  1. Earl J. Kirkland
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Correspondence to Earl J. Kirkland .

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Kirkland, E.J. (2010). The Fourier Projection Theorem. In: Advanced Computing in Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4419-6533-2_10

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