Failure Rate Modeling

  • J.W. McPherson
Chapter

Abstract

For a collection of devices, it is critically important to be able to understand the expected failure rate for the devices. For the supplier of such devices, the expected failure rate will be an important indicator of future warranty liability. For the customer, the expected failure rate will be an important indicator of future satisfaction. For mission-critical applications, it is of paramount importance for one to know that the expected failure rate will be extremely low.

Keywords

Fatigue 

References

  1. McPherson, J: Accelerated Testing. In: Electronic Materials Handbook, Vol. 1 Packaging, ASM International, 887 (1989).Google Scholar
  2. Miller, I. and J. Freund: Probability and Statistics for Engineers, 2 nd. Ed. Prentice-Hall, (1977).Google Scholar
  3. Thomas, T. and P. Lawler: Statistical Methods for Reliability Prediction. In: Electronic Materials Handbook, Vol. 1 Packaging, ASM International, 895 (1989).Google Scholar

Copyright information

© Springer Science+Business Media, LLC 2010

Authors and Affiliations

  • J.W. McPherson
    • 1
  1. 1.Texas Instruments Senior Fellow EmeritusPlanoUSA

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