Engineers are constantly confronted with time issues. Applying a constant stress and waiting for failure can be very time consuming. Thus, it is only natural to ask the question — does a rapid time-zero test exist that can be used on a routine sampling basis to monitor the reliability of the materials/devices? The answer to this question is often yes and it is called the ramp-to-failure test. While the test is destructive in nature (one has to sacrifice materials/devices), it is generally much more rapid than conventional constant-stress time-to-failure tests. The relative quickness of the test also enables the gathering of more data and thus the gathering of better statistics.
KeywordsWeibull Distribution Acceleration Factor Ramp Rate Linear Ramp Ramp Test
- Anolick, E. and G. Nelson: Low-Field Time-Dependent Dielectric Breakdown, IEEE International Reliability Symposium Proceedings, 8 (1979).Google Scholar
- Berman, A.: Time-Zero Dielectric Breakdown by a Ramp Method, IEEE International Reliability Symposium Proceedings, 204 (1981).Google Scholar
- McPherson, J.: Stress-Dependent Activation Energy, IEEE International Reliability Symposium Proceedings, 12 (1986).Google Scholar