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Replica Techniques

  • Jeanne Ayache
  • Luc Beaunier
  • Jacqueline Boumendil
  • Gabrielle Ehret
  • Danièle Laub
Chapter

Abstract

The direct replica technique is used to make an impression of the surface topography of a sample that cannot be observed directly in the microscope because it is too large or too thick. The resulting replica gives an inverted topography image.

Keywords

Carbon Film Environmental Scanning Electron Microscope Metallic Particle Fume Hood Specimen Holder 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Copyright information

© Springer Science+Business Media, LLC 2010

Authors and Affiliations

  • Jeanne Ayache
    • 1
  • Luc Beaunier
    • 2
  • Jacqueline Boumendil
    • 3
  • Gabrielle Ehret
    • 4
  • Danièle Laub
    • 5
  1. 1.Laboratoire de Microscopie Moléculaire et CellulaireInstitut Gustave Roussy, Unité mixte, CNRS-UMR8126-IGRVillejuif CXFrance
  2. 2.Labo. Interfaces et Systémes ElectrochimiquesUniversité Paris VI, UPR 15 CNRSParis CX 05France
  3. 3.Centre de Microscopie Electronique, Appliquée à la Biologie et à la GéologieUniversité Lyon IVilleurbanne CXFrance
  4. 4.Inst. Physique et Chimie des MatériauxUniversité Strasbourg, CNRS-UMR 7504Strasbourg CX 2France
  5. 5.Faculté des Sciences de Base, Centre Interdisciplinaire de Microscopie ElectroniqueEcole Polytechnique Fédérale de LausanneLausanneSwitzerland

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