Abstract
The full array of microstructural, optical, and electrical materials characterization tools are used in the development of materials and processes for TCO applications. Most of these characterization tools are well described in other sources and are widely applied in the semiconductor and oxide fields of research. In this chapter, discussion is limited to a few of the methods used for characterizing the relationship between microstructure and electrical transport properties in transparent conducting materials particularly those that are based on the amorphous and crystalline oxides of In2O3, SnO2, and ZnO. These materials are currently of greatest practical importance for passive transparent electrode applications and they form the basis for the emerging field of oxide thin film transistor electronics.
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Paine, D.C., Yaglioglu, B., Berry, J. (2011). Characterization of TCO Materials. In: Ginley, D. (eds) Handbook of Transparent Conductors. Springer, Boston, MA. https://doi.org/10.1007/978-1-4419-1638-9_4
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