Abstract
Force microscopy, originally named atomic force microscopy by the inventors (Binnig et al., 1986), is a new type of measuring instrument in the nanometer range, down to the size of single atoms, developed after the invention of the scanning tunneling microscope (Binnig et al., 1982). These microscopes represent not only new types of imaging instruments, hence the term “microscopes,” but, more importantly, a new technology called scanning probe techniques (SPT). With these methods, one can measure and manipulate in the nanometer range in any environment, opening up a new field of interdisciplinary experimental science. The common features of these microscopes are a measurable and strongly distance-dependent parameter, a probe small enough for the desired spatial resolution, and a mechanism to scan over a surface with the necessary stability.
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Hörber, J.K.H., Mosbacher, J., Häberle, W. (1995). Force Microscopy on Membrane Patches. In: Sakmann, B., Neher, E. (eds) Single-Channel Recording. Springer, Boston, MA. https://doi.org/10.1007/978-1-4419-1229-9_17
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DOI: https://doi.org/10.1007/978-1-4419-1229-9_17
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