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Diagnosis and Design-for-Diagnosis

  • Patrick Girard
  • Alberto Bosio
  • Luigi Dilillo
  • Serge Pravossoudovitch
  • Arnaud Virazel
Chapter

Abstract

Nowadays, the latest technologies permit very high degree of integration allowing a number of circuits per die much higher than in the past. These new technologies are also more prone to defects, parasitic phenomena, and manufacturing variations, which may drastically reduce the yield. For this reason, fault detection, diagnosis, and defect localization are used in order to repair defective memories thus improving SoC reliability and yield. This chapter focuses on diagnosis and design-for-diagnosis techniques dedicated to SRAMs.

Keywords

Fault Model Voltage Level Read Operation Dynamic Fault Fault Dictionary 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Copyright information

© Springer Science+Business Media, LLC 2010

Authors and Affiliations

  • Patrick Girard
    • 1
  • Alberto Bosio
    • 1
  • Luigi Dilillo
    • 1
  • Serge Pravossoudovitch
    • 1
  • Arnaud Virazel
    • 1
  1. 1.LIRMM - Laboratoire d’Informatique de Robotique de Microélectronique de MontpellierMontpellierFrance

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