Abstract
Nowadays, the latest technologies permit very high degree of integration allowing a number of circuits per die much higher than in the past. These new technologies are also more prone to defects, parasitic phenomena, and manufacturing variations, which may drastically reduce the yield. For this reason, fault detection, diagnosis, and defect localization are used in order to repair defective memories thus improving SoC reliability and yield. This chapter focuses on diagnosis and design-for-diagnosis techniques dedicated to SRAMs.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsAuthor information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2010 Springer Science+Business Media, LLC
About this chapter
Cite this chapter
Girard, P., Bosio, A., Dilillo, L., Pravossoudovitch, S., Virazel, A. (2010). Diagnosis and Design-for-Diagnosis. In: Advanced Test Methods for SRAMs. Springer, Boston, MA. https://doi.org/10.1007/978-1-4419-0938-1_8
Download citation
DOI: https://doi.org/10.1007/978-1-4419-0938-1_8
Published:
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4419-0937-4
Online ISBN: 978-1-4419-0938-1
eBook Packages: EngineeringEngineering (R0)