Diagnosis and Design-for-Diagnosis
Nowadays, the latest technologies permit very high degree of integration allowing a number of circuits per die much higher than in the past. These new technologies are also more prone to defects, parasitic phenomena, and manufacturing variations, which may drastically reduce the yield. For this reason, fault detection, diagnosis, and defect localization are used in order to repair defective memories thus improving SoC reliability and yield. This chapter focuses on diagnosis and design-for-diagnosis techniques dedicated to SRAMs.