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Introduction

  • Rajesh Garg
  • Sunil P. Khatri
Chapter

Abstract

With decreasing device feature sizes, reduced supply voltages, and increasing operating frequencies, very large scale integration (VLSI) systems are becoming susceptible to effects such as power and ground noise, capacitive coupling noise, radiation particle strikes or single event effects (SEE), etc. Radiation particle strikes affect the transient electrical behavior of a circuit and can result in functional errors. At the same time, with device scaling, the variations of key device parameters are increasing at an alarming rate. Because of this, it is becoming difficult to predict the performance of a VLSI design. Thus, both these issues (radiation particle strikes and process variations) result in unpredictable behavior of circuits and hence severely degrade the reliability of VLSI systems. Because of the widespread use of modern VLSI systems, it is necessary to address these issues during the design phase, to improve system reliability and resilience to radiation strikes and process variations. This is the focus of this monograph. This chapter provides background information about radiation particle strikes and process variations, and it describes how these issues affect VLSI circuit operation. This information will aid in understanding the analysis and design approaches presented in the remainder of this monograph. The goals of this monograph are also presented in this chapter along with an outline of the remaining chapters.

Keywords

Linear Energy Transfer Charge Collection Very Large Scale Integration Combinational Logic Soft Error 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag US 2010

Authors and Affiliations

  1. 1.HillsboroUSA
  2. 2.Department of Electrical and Computer EngineeringTexas A & M UniversityCollege StationUSA

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