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Test Strategies for Multivoltage Designs

  • Saqib Khursheed
  • Bashir M. Al-Hashimi
Chapter

Abstract

Reducing the power consumption of digital designs through the use of more than one Vdd value (multivoltage) is known and well practiced. Some manufacturing defects have Vdd dependency, which implies that defects can become active only at certain power supply setting, leading to reduced defect coverage. This chapter presents a coherent overview of recently reported research in testing strategies for multivoltage designs including defect modeling, test generation, and DFT solutions. The chapter also outlines number of worthy research problems that need to be addressed to develop high-quality and cost-effective test solutions for multi-Vdd designs.

Keywords

Supply Voltage Test Pattern Defect Coverage Soft Error Open Defect 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgements

The authors are thankful to Dr. Ilia Polian (Albert-Ludwigs-University of Freiburg) for useful comments and EPSRC (UK) for supporting this work under Grant EP/DO57663/1.

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Copyright information

© Springer Science+Business Media, LLC 2010

Authors and Affiliations

  1. 1.University of SouthamptonSouthamptonUK

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