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Removing Relativistic Effects in EELS for the Determination of Optical Properties

  • M Stöger-Pollach
  • A Laister
  • P Schattschneider
  • P Potapov
  • H J Engelmann
Part of the Springer Proceedings in Physics book series (SPPHY, volume 120)

Summary

Obtaining correct optical properties from low loss electron energy loss spectrometry data is impossible as long as retardation effects are not taken into account. In the present work we discuss three methods of removal of Čerenkov and wave guide losses in order to improve the accuracy of the Kramers-Kronig Analysis of semiconducting materials.

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References

  1. 1.
    Stöger-Pollach M et al 2006 Micron 34, 396CrossRefGoogle Scholar
  2. 2.
    Stöger-Pollach M and Schattschneider P, Ultramicroscopy in Press Google Scholar
  3. 3.
    Kröger E 1968 Zeitschrift f. Physik 216, 115CrossRefADSGoogle Scholar
  4. 4.
    Ritchie R H 1957 Phys. Rev. 106, 874CrossRefADSMathSciNetGoogle Scholar
  5. 5.
    Palik E D 1985–1991 Handbook of optical constants of solids (Orlando, FL, US)Google Scholar

Copyright information

© Springer Science+Business Media B.V. 2008

Authors and Affiliations

  • M Stöger-Pollach
    • 1
  • A Laister
    • 2
  • P Schattschneider
    • 1
    • 2
  • P Potapov
    • 3
  • H J Engelmann
    • 3
  1. 1.University Service Centre for TEMVienna University of TechnologyViennaAustria
  2. 2.Institute of Solid State PhysicsVienna University of TechnologyViennaAustria
  3. 3.Materials Analysis LabAMD Saxony LLC. and Co. KGDresdenGermany

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