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Novel Method for the Measurement of STEM Specimen Thickness by HAADF Imaging

  • V Grillo
  • E Carlino
Part of the Springer Proceedings in Physics book series (SPPHY, volume 120)

Summary

The accurate measurement of chemistry of epitaxial layers by high angle annular dark field imaging requires knowledge of the scanning transmission electron microscopy specimen thickness. Here, it is shown how the study of the intensity of the Fourier coefficients of high angle annular dark field images, as a function of the objective lens defocus, can be used to measure the specimen thickness with the highest accuracy in the location of the area of interest.

Keywords

Fourier Coefficient Scanning Transmission Electron Microscopy Specimen Thickness Convergent Beam Electron Diffraction High Angle Annular Dark Field 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media B.V. 2008

Authors and Affiliations

  • V Grillo
    • 1
  • E Carlino
    • 1
  1. 1.Laboratorio Nazionale TASC, INFM-CNR, Area Science ParkTriesteItaly

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