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(S)TEM Characterisation of InAs/MgO/Co Multilayers

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Microscopy of Semiconducting Materials 2007

Part of the book series: Springer Proceedings in Physics ((SPPHY,volume 120))

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Summary

The structural integrity, composition and interface quality of tunnel barriers in hybrid ferromagnet-semiconductor structures will have a significant effect on the properties of spintronic devices. We present the results of a study of an amorphous MgO tunnel barrier in a Co/MgO/InAs multilayer structure. Optimum growth parameters for MgO and surface treatment of InAs have been identified by a systematic electron microscopy investigation. Electron energy loss spectroscopy has been used to obtain information on composition and interface quality in the multilayer structures.

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Author information

Authors and Affiliations

  1. Dept. of Materials, Imperial College London, SW7 2AZ, London

    D A Eustace, D W McComb, L Buckle, P Buckle, T Ashley, L J Singh, Z H Barber, A M Gilbertson, W R Branford, S K Clowes & L F Cohen

  2. Quantum Electronics and Sensor Technology, Qinetiq PLC, WR14 3PS, Malvern

    L Buckle, P Buckle & T Ashley

  3. Dept. of Materials Science and Metallurgy, University of Cambridge, Cambridge, CB2 3QZ

    L J Singh & Z H Barber

  4. Dept. of Physics, Blackett Laboratory, Imperial College London, London, SW7 2AZ

    A M Gilbertson, W R Branford, S K Clowes & L F Cohen

Authors
  1. D A Eustace
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  2. D W McComb
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  3. L Buckle
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  4. P Buckle
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  5. T Ashley
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  6. L J Singh
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  7. Z H Barber
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  8. A M Gilbertson
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  9. W R Branford
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  10. S K Clowes
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  11. L F Cohen
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Editor information

Editors and Affiliations

  1. Department of Electronic and Electrical Engineering, University of Sheffield, Mappin Street, Sheffield, S1 3JD, UK

    A. G. Cullis

  2. Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ, UK

    P. A. Midgley

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© 2008 Springer Science+Business Media B.V.

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Eustace, D. et al. (2008). (S)TEM Characterisation of InAs/MgO/Co Multilayers. In: Cullis, A.G., Midgley, P.A. (eds) Microscopy of Semiconducting Materials 2007. Springer Proceedings in Physics, vol 120. Springer, Dordrecht. https://doi.org/10.1007/978-1-4020-8615-1_32

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