Progress in Aberration-Corrected High-Resolution Transmission Electron Microscopy of Crystalline Solids

  • K Tillmann
  • J Barthel
  • L Houben
  • C L Jia
  • M Lentzen
  • A Thust
  • K Urban
Conference paper
Part of the Springer Proceedings in Physics book series (SPPHY, volume 120)

Summary

With impressive improvements in instrumental resolution and a simultaneous minimisation of image delocalisation, high-resolution transmission electron microscopy is presently enjoying increased popularity in the atomic-scale imaging of lattice imperfections in a variety of solids. In the present overview, recent progress in spherical aberration corrected imaging performed in troika with the ultra-precise measurement of residual wave aberrations and the numerical retrieval of the exit plane wavefunction from focal series of micrographs is illustrated by highlighting their combined use for the atomic-scale measurement of common lattice imperfections observed in compound semiconductors and high-temperature superconductors.

Keywords

Zinc Chromium Cage Argon Arsenic 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    Hirsch P B, Horne WH and Whelan M J 1956 Phil. Mag. 1, 677CrossRefADSGoogle Scholar
  2. 2.
    Menter J W 1956, Proc. Roy. Soc. A 236, 119CrossRefADSGoogle Scholar
  3. 3.
    Bollmann W 1956 Phys. Rev. 103, 1588CrossRefADSGoogle Scholar
  4. 4.
    Rose H 1990 Optik 85, 19Google Scholar
  5. 5.
    Haider M, Rose H, Uhlemann S, Schwan E, Kabius B and Urban K 1998 Ultramicroscopy 75, 53CrossRefGoogle Scholar
  6. 6.
    Tiemeijer P C 1999 Ultramicroscopy 78, 53CrossRefGoogle Scholar
  7. 7.
    Kahl F and Rose H 2000 Proc. EUREM-2000, Vol. 3, eds P Schaue r, I Müllerová and L Frank (Brno: Czek Microscopy Society) ppGoogle Scholar
  8. 8.
    Su D S, Zandbergen H W, Tiemeijer P C 2003 Micron 34, 235PubMedCrossRefGoogle Scholar
  9. 9.
    Lentzen M, Jahnen B, Jia C L, Thust A, Tillmann K and Urban K 2002 Ultramicroscopy 92, 233PubMedCrossRefGoogle Scholar
  10. 10.
    Lentzen M 2006 Microsc. Microanal. 12, 191PubMedCrossRefADSGoogle Scholar
  11. 11.
    Uhlemann S and Haider M 1998 Ultramicroscopy 72, 109CrossRefGoogle Scholar
  12. 12.
    Coene W M J, Janssen G, Op de Beeck M and van Dyck D 1992 Phys. Rev. Lett. 69, 3743PubMedCrossRefADSGoogle Scholar
  13. 13.
    Thust A, Coene W M J, Op de Beeck M and van Dyck D 1996 Ultramicroscopy 64, 211CrossRefGoogle Scholar
  14. 14.
    Kirkland A I, Saxton O W, Chau K L, Tsuno K and Kawasaki M 1995 Ultramicroscopy 57, 355CrossRefGoogle Scholar
  15. 15.
    Lichte H 1986 Ultramicroscopy 20, 293CrossRefGoogle Scholar
  16. 16.
    Lehmann M and Lichte H 2002 Microsc. Microanal. 8, 447PubMedCrossRefADSGoogle Scholar
  17. 17.
    Jia C L, Lentzen M and Urban K 2003 Science 299, 870PubMedCrossRefADSGoogle Scholar
  18. 18.
    Hartel P, Müller H, Uhlemann S and Haider M 2004 Proc. EMC-2004, eds N Schryvers and J P Timmermanns (Antwerp: Belgian Society for Microscopy), pp IM01.P02Google Scholar
  19. 19.
    Barthel J 2007 PhD Thesis RWTH Aachen UniversityGoogle Scholar
  20. 20.
    Zemlin F, Weiss K, Schiske P, Kunath W and Herrmann K H 1978 Ultramicroscopy 3, 49CrossRefGoogle Scholar
  21. 21.
    Hawkes P and Kapser E 1989 Principles of Electron Optics (London: Academic Press)Google Scholar
  22. 22.
    Tillmann K, Thust A and Urban K 2004 Microsc. Microanal. 10, 185PubMedADSGoogle Scholar
  23. 23.
    Houben L, Thust A and Urban K 2006 Ultramicroscopy 106, 200PubMedCrossRefGoogle Scholar
  24. 24.
    Tillmann K, Houben L and Thust A 2006 Phil. Mag. 86, 4589CrossRefADSGoogle Scholar
  25. 25.
    Kilaas R, Paciornik S, Schwartz AJ and Tanner L E 1994 Journal of Computer-Assisted Microscopy 6, 129Google Scholar
  26. 26.
    Tillmann K, Houben L, Thust A and Urban K 2006 J. Mater. Sci. 41, 4420CrossRefGoogle Scholar
  27. 27.
    Guzenko VA,Thillosen N, Dahmen A, Calarco R, Schäpers T, Houben L, Schineller B, Heuken M and Kaluza A 2004 J. Appl. Phys. 96, 5663CrossRefADSGoogle Scholar
  28. 28.
    Kisielowski C, Freitag B, Xu X, Beckmann SP and Chrzan D C 2006 Phil. Mag. 86, 4575CrossRefADSGoogle Scholar
  29. 29.
    Lim S H, Shindo D, Yonenaga I, Brown PD and Humphreys C J 1998 Phys. Rev. Lett. 81, 5350CrossRefADSGoogle Scholar
  30. 30.
    Hirth JP and Lothe J 1968 Theory of Dislocations (New York: McGraw-Hill)Google Scholar

Copyright information

© Springer Science+Business Media B.V. 2008

Authors and Affiliations

  • K Tillmann
    • 1
  • J Barthel
    • 1
  • L Houben
    • 1
  • C L Jia
    • 1
  • M Lentzen
    • 1
  • A Thust
    • 1
  • K Urban
    • 1
  1. 1.Institute of Solid State Research and Ernst Ruska-Centre for Microscopy and Spectroscopy with ElectronsResearch Centre JülichJülichGermany

Personalised recommendations