Recent Studies of Heteroepitaxial Systems
Electron microscopy methods have been used extensively in recent collaborative studies involving the growth and characterization of semiconductor heterostructures and nanostructures. Examples that are described here include epilayers and nanowires, as well as quantum wells and quantum dots, while the heteroepitaxial systems represented include II-VI, III–V and IV–IV compounds as well as mixed valence materials. Ferromagnetic Cr-doped nitride semiconductors are also briefly discussed. Control over the growth and processing conditions in concert with the microstructural information available from electron microscopy is confirmed as being essential for achieving materials of the highest possible quality.
KeywordsMisfit Dislocation Molecular Beam Epitaxy Growth Electron Microscopy Method Lateral Phase Separation Heteroepitaxial System
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