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Quantitative Analysis of Deformation Around a Nanoindentation in GaN by STEM Diffraction

  • K K McLaughlin
  • W J Clegg
Conference paper
Part of the Springer Proceedings in Physics book series (SPPHY, volume 120)

Summary

The lattice rotations underneath a nanoindentation in GaN are measured from the energy-filtered convergent beam electron diffraction patterns generated by scanning transmission electron microscopy (STEM). These rotations reveal a kink band not visible in STEM high angle annular dark field images. Furthermore, the diffraction data allows the lowest-energy configuration of dislocations associated with the kink band rotations to be estimated.

Keywords

Scanning Transmission Electron Microscopy Lattice Rotation Gallium Nitride Kink Band High Angle Annular Dark Field 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media B.V. 2008

Authors and Affiliations

  • K K McLaughlin
    • 1
  • W J Clegg
    • 1
  1. 1.Department of Materials Science and MetallurgyUniversity of CambridgeCambridgeUK

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