Quantitative Analysis of Deformation Around a Nanoindentation in GaN by STEM Diffraction
The lattice rotations underneath a nanoindentation in GaN are measured from the energy-filtered convergent beam electron diffraction patterns generated by scanning transmission electron microscopy (STEM). These rotations reveal a kink band not visible in STEM high angle annular dark field images. Furthermore, the diffraction data allows the lowest-energy configuration of dislocations associated with the kink band rotations to be estimated.
KeywordsScanning Transmission Electron Microscopy Lattice Rotation Gallium Nitride Kink Band High Angle Annular Dark Field
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