Abstract
We present Shannon sampling theory for functions defined on \(T \times \mathbb{R} \) × ℝ, where T denotes the circle group, prove a new estimate for the aliasing error, and apply the result to parallel-beam diffraction tomography. The class of admissible sampling lattices is characterized and general sampling conditions are derived which lead to the identification of new efficient sampling schemes. Corresponding results for x-ray tomography are obtained in the high-frequency limit.
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Faridani, A. (1998). Sampling in Parallel-Beam Tomography. In: Ramm, A.G. (eds) Inverse Problems, Tomography, and Image Processing. Springer, Boston, MA. https://doi.org/10.1007/978-1-4020-7975-7_3
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DOI: https://doi.org/10.1007/978-1-4020-7975-7_3
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